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Data presence value
production traces
Analysis type
reflected-light microscopy
Data presence value
elemental composition
Analysis type
p-XRF
Data presence value
production traces
Analysis type
reflected-light microscopy
Data presence value
elemental composition
Analysis type
p-XRF
Data presence value
intentional fragmentation
Analysis type
reflected-light microscopy
Data presence value
production traces
Analysis type
reflected-light microscopy
Data presence value
negative result
Analysis type
microCT
Data presence value
no macroresidues
Analysis type
macroscopic analysis
optodigital microscopy
Data presence value
no microresidues
Analysis type
macroscopic analysis
optodigital microscopy
Data presence value
chemical analysis of surface
Analysis type
SEM
EDS
Pagination
First page
« First
Previous page
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…
Page
188
Page
189
Page
190
Page
191
Page
192
Page
193
Page
194
Page
195
Page
196
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Next ›
Last page
Last »
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