Data presence value
manipulative traces
Analysis type
reflected-light microscopy
Data presence value
microstructure
Analysis type
CT
RTG
Data presence value
n/a
Data presence value
chemical analysis of material
Analysis type
SEM
EDS
Data presence value
chemical analysis of surface
Analysis type
SEM
EDS
Data presence value
n/a
Data presence value
chemical analysis of material
Analysis type
SEM
EDS
XRD
Data presence value
chemical analysis of surface
Analysis type
SEM
EDS
XRD
Data presence value
negative results
Note on method
due to the preservation process
Data presence value
elemental composition
Analysis type
p-XRF